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| author | Wolfram Sang <wsa+renesas@sang-engineering.com> | 2024-04-26 07:59:20 +0200 |
|---|---|---|
| committer | Wolfram Sang <wsa+renesas@sang-engineering.com> | 2024-04-26 07:59:20 +0200 |
| commit | 58cd9e03cff0883a77c1ffd774a5506639c9c1d7 (patch) | |
| tree | caa18211f3a08842817fbab372e8344b856af6ce | |
| parent | ed30a4a51bb196781c8058073ea720133a65596f (diff) | |
| parent | f42c97027fb75776e2e9358d16bf4a99aeb04cf2 (diff) | |
| download | linux-58cd9e03cff0883a77c1ffd774a5506639c9c1d7.tar.gz | |
Merge tag 'at24-fixes-for-v6.9-rc6' of git://git.kernel.org/pub/scm/linux/kernel/git/brgl/linux into i2c/for-current
at24 fixes for v6.9-rc6
- move the nvmem registration after the test one-byte read to improve the
situation with a race condition in nvmem
- fix the DT schema for ST M24C64-D
| -rw-r--r-- | Documentation/devicetree/bindings/eeprom/at24.yaml | 5 | ||||
| -rw-r--r-- | drivers/misc/eeprom/at24.c | 18 |
2 files changed, 10 insertions, 13 deletions
diff --git a/Documentation/devicetree/bindings/eeprom/at24.yaml b/Documentation/devicetree/bindings/eeprom/at24.yaml index 1812ef31d5f1e9..3c36cd0510de83 100644 --- a/Documentation/devicetree/bindings/eeprom/at24.yaml +++ b/Documentation/devicetree/bindings/eeprom/at24.yaml @@ -69,14 +69,10 @@ properties: - items: pattern: c32$ - items: - pattern: c32d-wl$ - - items: pattern: cs32$ - items: pattern: c64$ - items: - pattern: c64d-wl$ - - items: pattern: cs64$ - items: pattern: c128$ @@ -136,6 +132,7 @@ properties: - renesas,r1ex24128 - samsung,s524ad0xd1 - const: atmel,24c128 + - pattern: '^atmel,24c(32|64)d-wl$' # Actual vendor is st label: description: Descriptive name of the EEPROM. diff --git a/drivers/misc/eeprom/at24.c b/drivers/misc/eeprom/at24.c index 572333ead5fb8b..4bd4f32bcdabb8 100644 --- a/drivers/misc/eeprom/at24.c +++ b/drivers/misc/eeprom/at24.c @@ -758,15 +758,6 @@ static int at24_probe(struct i2c_client *client) } pm_runtime_enable(dev); - at24->nvmem = devm_nvmem_register(dev, &nvmem_config); - if (IS_ERR(at24->nvmem)) { - pm_runtime_disable(dev); - if (!pm_runtime_status_suspended(dev)) - regulator_disable(at24->vcc_reg); - return dev_err_probe(dev, PTR_ERR(at24->nvmem), - "failed to register nvmem\n"); - } - /* * Perform a one-byte test read to verify that the chip is functional, * unless powering on the device is to be avoided during probe (i.e. @@ -782,6 +773,15 @@ static int at24_probe(struct i2c_client *client) } } + at24->nvmem = devm_nvmem_register(dev, &nvmem_config); + if (IS_ERR(at24->nvmem)) { + pm_runtime_disable(dev); + if (!pm_runtime_status_suspended(dev)) + regulator_disable(at24->vcc_reg); + return dev_err_probe(dev, PTR_ERR(at24->nvmem), + "failed to register nvmem\n"); + } + /* If this a SPD EEPROM, probe for DDR3 thermal sensor */ if (cdata == &at24_data_spd) at24_probe_temp_sensor(client); |